Determination of critical island size in -sexiphenyl islands on SiO using capture-zone scaling

S. Lorbek , G. Hlawacek , C. Teichert

One of the important parameters in understanding the mechanism of the early stage of organic thin-film growth is the critical nucleus size . Here, submonolayer films of -sexiphenyl grown on amorphous silicon dioxide substrates were investigated by means of atomic-force microscopy and have been analyzed using the recently proposed capture-zone scaling. Applying the generalized Wigner surmise we determine from the capture-zone distribution at room temperature and 373 K. The results are compared to traditional analysis by island-size scaling and the applicability of the capture-zone scaling is critically discussed with respect to island shape.

Mots clés: Physical Sciences

Domaines: Physique [physics]

S. Lorbek, G. Hlawacek, C. Teichert. Determination of critical island size in -sexiphenyl islands on SiO using capture-zone scaling. European Physical Journal: Applied Physics, 2011, 55 (2), ⟨10.1051/epjap/2011100428⟩. ⟨hal-00723605⟩