RF Front-End Test Using Built-in Sensors

L. Abdallah (1) , Haralampos-G Stratigopoulos (1) , Salvador Mir (1) , C. Kelma (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 NXP Semiconductors

This article proposes a new class of sensors for built-in test in RF devices. These sensors are placed in close proximity to the DUT on the same substrate without being electrically connected to it. Instead, they monitor it by virtue of being subjected to the same process variations. The authors also describe other types of sensors they have studied, including DC probes, an envelope detector, and a current sensor.

Mots clés: built-in self test; integrated-circuit-testing

Domaines: Micro et nanotechnologies/Microélectronique

L. Abdallah, Haralampos-G Stratigopoulos, Salvador Mir, C. Kelma. RF Front-End Test Using Built-in Sensors. IEEE Design & Test, 2011, 28 (6), pp.76-84. ⟨10.1109/MDT.2011.131⟩. ⟨hal-00672386⟩