Characterization of the Electromagnetic Susceptibility of Integrated Circuits using a Near Field Scan

Alexandre Boyer (1) , Sonia Ben Dhia (1) , Etienne Sicard (1)

1 LATTIS - Laboratoire Toulousain de Technologie et d'Ingénierie des Systèmes

The paper describes a susceptibility characterization test for integrated circuits using a miniature magnetic near field probe. The method is efficient up to a frequency of 6 GHz and maps immunity to radiated fields.

Mots clés: Near-field scan; Integrated Circuits; Immunity

Domaines: Electronique

Alexandre Boyer, Sonia Ben Dhia, Etienne Sicard. Characterization of the Electromagnetic Susceptibility of Integrated Circuits using a Near Field Scan. Electronics Letters, 2007, 43 (1), pp.15. ⟨hal-00669747⟩