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Article Dans Une Revue IEEE Transactions on Instrumentation and Measurement Année : 2012

On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations

Résumé

With the growing concerns about electromagnetic compatibility of integrated circuits, the need for accurate prediction tools and models to reduce risks of non-compliance becomes critical for circuit designers. However, on-chip characterization of noise is still necessary for model validation and design optimization. Although different on-chip measurement solutions have been proposed for emission issue characterization, no on-chip measurement methods have been proposed to address the susceptibility issues. This paper presents an on-chip noise sensor dedicated to the study of circuit susceptibility to electromagnetic interferences. A demonstration of the sensor measurement performances and benefits is proposed through a study of the susceptibility of a digital core to conducted interferences. Sensor measurements ensure a better characterization of actual coupling of interferences within the circuit and a diagnosis of failure origins.
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Dates et versions

hal-00668627 , version 1 (13-02-2012)

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Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikael Deobarro, Dinh Than Vinh. On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Transactions on Instrumentation and Measurement, 2012, 61 (3), pp.696. ⟨10.1109/TIM.2011.2172116⟩. ⟨hal-00668627⟩
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