Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application

P. Salzenstein (1) , N. Cholley (1) , M. Zarubin (1) , E. Pavlyuchenko (1) , A. Hmima (1) , Y.K. Chembo (1) , L. Larger (1)

1 FEMTO-ST - Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174)

The performance advances in communication systems like Radar system, precision navigation, space application and time and frequency metrology require more stable frequency and low phase noise system. Here is presented a configuration of phase noise measurement system operating in X-band using a photonic delay line as a frequency discriminator. This system doesn't need any excellent frequency reference and works for any frequency between 8.2 and 12.4 GHz. Using cross correlation on 500 averages, noise floor of the instrument is respectively -150 and -170 dBc/Hz at 10(1) and 10(4) Hz from the 10 GHz carrier (-90 and -170 dBc/Hz including 2 km delay lines). This instrument is developed in the context of association with the national french metrology institute (laboratoire national de metrologie et d'essais, LNE). This calibration system is to be integrated in measurements means of the accredited laboratory to improve the Calibration Metrology Capabilities (CMC) of the LNE.

Mots clés: Optoelectronic; phase noise; metrology; X-band; microwaves; photonic delay line; Calibration Metrology capabilities

Domaines: Optique / photonique

P. Salzenstein, N. Cholley, M. Zarubin, E. Pavlyuchenko, A. Hmima, et al.. Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application. SPIE Optics + Optoelectronics, Conference on Nonlinear Optics and Applications V, Apr 2011, Prague, Czech Republic. pp.807111, ⟨10.1117/12.886694⟩. ⟨hal-00655139⟩