Study of Ion Beam Mixing by x ray reflectometry

David Simeone (1, 2) , Dominique Gosset (1, 2) , Laurence Lunéville (1, 3) , Gianguido Baldinozzi (1, 2) , N. Moncoffre (4) , C. Deranlot (5)

1 SPMS - Laboratoire Structures, Propriétés et Modélisation des solides
2 LA2M - Laboratoire d'Analyse Microstructurale des Matériaux
3 LLPR - Laboratoire de Logiciels pour la Physique des Réacteurs
4 ACE
5 Laboratoire Albert Fert (ex-UMPhy Unité mixte de physique CNRS/Thales)

We present in this text a new experimental tool to study the mixing of atoms under irradiation. Based on physics of x ray diffraction, the specular reflectivy of x ray was used to estimate the Auto Correlation Function associated with the electron density gradient. The accuracy of the ACF is around 1 nanometer and does not evolve with the thickness of the probed layer. Thus, this point allows accurately measuring the broadening of the electron density gradient spreading induced by irradiation. Such an accurate profile extracted over a large range of fluences (about 3 decades) would lead to the determination of the functional dependence of this spreading with the fluence. This could allow pointing out the main mechanisms triggering the atomic mixing over large distances when atomic mixing occurring in thermal spikes is washed out.

Domaines: Science des matériaux [cond-mat.mtrl-sci]

David Simeone, Dominique Gosset, Laurence Lunéville, Gianguido Baldinozzi, N. Moncoffre, et al.. Study of Ion Beam Mixing by x ray reflectometry. Symposium R: Radiation Damage to Ceramic and Insulating Materials for Nuclear Power, Nov 2010, Boston, United States. pp.179-184, ⟨10.1557/opl.2011.395⟩. ⟨hal-00639155⟩