Applications of the Oxford-JEOL Aberration Corrected Electron Microscope

Peter D Nellist (1) , Angus Kirkland (2)

1 Department of Materials
2 Oxford University

In this contribution we review the use of aberration corrected electron microscopy at Oxford from 2003 to the present day. In particular, examples of work carried out in Oxford in this period are described in the areas of aberration corrected exit wavefunction reconstruction and high resolution annular dark field-imaging of ceramic interfaces. New possibilities making use of the unique capability of the Oxford instruments are discussed, in particular the development of scanning confocal electron microscopy.

Mots clés: Physical Sciences

Peter D Nellist, Angus Kirkland. Applications of the Oxford-JEOL Aberration Corrected Electron Microscope. Philosophical Magazine, 2010, 90 (35-36), pp.4751-4767. ⟨10.1080/14786435.2010.516775⟩. ⟨hal-00633211⟩