An integrated phase noise measurement bench for on-chip characterization of resonators and VCOs

Sylvain Godet (1) , Éric Tournier (1) , Olivier Llopis (1) , Andreia Cathelin (2)

1 LAAS-MOST - Équipe Microondes et Opto-microondes pour Systèmes de Télécommunications
2 STMicroelectronics

A phase noise measurement bench is integrated on a 3.6 mm2 silicon chip. The bench includes a splitter with quadrature outputs, a phase detector, a low noise baseband amplifier and, if necessary, a synthesized source. Applications to the characterization of frequency sources and BAW resonators are discussed.

Mots clés: Phase noise; Built-in-self-test (BIST); integrated circuit; phase detection; SMR resonator

Domaines: Micro et nanotechnologies/Microélectronique

Sylvain Godet, Éric Tournier, Olivier Llopis, Andreia Cathelin. An integrated phase noise measurement bench for on-chip characterization of resonators and VCOs. IEEE International Frequency Control Symposium (IFCS) and European Frequency and Time Forum (EFTF), joint conference, May 2011, San Francisco, United States. p.108-112. ⟨hal-00617610⟩