Sub-wavelength surface IR imaging of soft-condensed matter

J. H. Rice , G. A. Hill , S. R. Meech , P. Kuo , K. Vodopyanov , M. Reading

Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.

Mots clés: Physical Sciences

J. H. Rice, G. A. Hill, S. R. Meech, P. Kuo, K. Vodopyanov, et al.. Sub-wavelength surface IR imaging of soft-condensed matter. European Physical Journal: Applied Physics, 2010, 51 (2), ⟨10.1051/epjap/2010093⟩. ⟨hal-00606641⟩