A first approach on the failure mechanisms of IGBT inverters for aeronautical applications: effect of humidity-pressure combination - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2010

A first approach on the failure mechanisms of IGBT inverters for aeronautical applications: effect of humidity-pressure combination

Résumé

Comparing to the most common reliability tests this work presents a new approach of accelerated testing, by combining temperature, humidity and pressure cycling with voltage stress. A design of experiments methodology has been proposed to test IGBT inverters and understand environmental factors effect. The humidity-pressure combination effect is studied for various IGBT inverter packaging materials.
Fichier principal
Vignette du fichier
PID1255629.pdf (601.52 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-00584142 , version 1 (07-04-2011)

Identifiants

  • HAL Id : hal-00584142 , version 1

Citer

Hassan Abbad, Stephane Azzopardi, Eric Woirgard, Jean-Yves Delétage, P. Rollin, et al.. A first approach on the failure mechanisms of IGBT inverters for aeronautical applications: effect of humidity-pressure combination. IEEE International Power Electronics Conference, Jun 2010, Sapporo, Japan. pp.xx-xx. ⟨hal-00584142⟩
189 Consultations
1267 Téléchargements

Partager

Gmail Facebook X LinkedIn More