Conducted Emission ICEM Model Compare to a Measure

Frédéric Lafon (1) , Francois de Daran (1) , Olivier Maurice (1)

1 VALEO

The purpose of this paper is to present emission prediction made with a microcontroler ICEM model, after what a comparison was made with measure of this emission, obtained in a automotive standard condition. We show that in a EMC prediction objective, the low frequency model allow to use and construct quite easy the ICEM model. For higher frequency, it would be uncontournable to measure precisely the device network impedance.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Frédéric Lafon, Francois de Daran, Olivier Maurice. Conducted Emission ICEM Model Compare to a Measure. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 92-94. ⟨hal-00519363⟩