Line geometry implications on crosstalk noise minimization

Miquel Roca (1) , E. Isern , F. Moll

1 University of Balearic Islands

In this work the different approaches to avoid crosstalk noise in VLSI integrated circuits are presented. The geometry of the cross-section of the lines is one of the more important parameters which must be considered when crosstalk problems are analyzed. Thus depending on this parameter we can select the best rule to avoid signal integrity problems in VLSI circuits. Several structures will be presented in this work in order to demonstrate the efficiency of the rules presented. The work is based on electromagnetic simulations to obtain the parasitic parameters, and HSPICE simulations using advanced CMOS technology models and very accurate distributed line models.

Mots clés: integrated circuit; electromagnetic compatibility; EMC; IC; emission; immunity; susceptibility; modelling; IEC

Domaines: Micro et nanotechnologies/Microélectronique

Miquel Roca, E. Isern, F. Moll. Line geometry implications on crosstalk noise minimization. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 49-52. ⟨hal-00517785⟩