Measurement system for adjacent electric field and magnetic field distributions on an IC package

Satoshi Kazama (1)

1 TAIYO YUDENCO

We have developed an adjacent electromagnetic field distribution measurement system using a unique sensor and three-input phase-difference measurement technique that can simultanously measure electric and magnetic field (magnitude and phase) distribution upto 3 GHz. The system can measure vector electric and magnetic field distribution on an IC package with lead frame level resolution. These electromagnetic distributions are effective in evaluatinf the EMI from an IC.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Satoshi Kazama. Measurement system for adjacent electric field and magnetic field distributions on an IC package. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 15-18. ⟨hal-00517654⟩