Improving the Efficiency of Dynamic Fault Tree Analysis by Considering Gate FDEP as Static - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2010

Improving the Efficiency of Dynamic Fault Tree Analysis by Considering Gate FDEP as Static

Résumé

This paper focuses on one of the dynamic gates which are used in Dynamic Fault Trees (DFT), which is the Functional Dependency (FDEP) gate. Gate FDEP has been considered as equivalent to a set of OR gates in the literature, but this equivalence has seldom been exploited for the analysis of DFTs. In this paper, we show that in most cases, starting from a DFT including FDEP gates, the use of this static equivalence provides significant advantages for DFT Analysis.
Fichier principal
Vignette du fichier
20100421_ESREL_FDEP.pdf (533.53 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-00516896 , version 1 (13-09-2010)

Identifiants

  • HAL Id : hal-00516896 , version 1

Citer

Guillaume Merle, Jean-Marc Roussel, Jean-Jacques Lesage. Improving the Efficiency of Dynamic Fault Tree Analysis by Considering Gate FDEP as Static. European Safety and Reliability Conference (ESREL 2010), Sep 2010, Rhodes, Greece. pp. 845-851. ⟨hal-00516896⟩
233 Consultations
515 Téléchargements

Partager

Gmail Facebook X LinkedIn More