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| HAL : hal-00491923, version 1 |
| Fiche détaillée |  Récupérer au format |
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| 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), La Grande Motte : France (2010) |
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| Read-Error-Rate evaluation for RFID system on-line testing |
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| Gilles Fritz 1Vincent Beroulle 1 |
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| (07/06/2010) |
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| RFID systems are complex hybrid systems, consisting of analog and digital hardware and software components. RFID technologies are often used into critical domains or into harsh environments. But RFID system is only based on low cost equipments which then do not allow achieving robust communications. All these points make the on-line testing of RFID systems a very complex task. Thus, this article proposes the on-line characterization of a statistical system parameter, the Read-Error-Rate, to perform the on-line detection of faulty RFID components. As an introduction to the on-line testing of RFID systems, a FMEA first describes the effects on these systems of potential defects impacting the communication part. Second, a SystemC model of the RFID system is discussed as a way to evaluate the proposed test solutions. Finally, the way the maximal Read-Error-Rate can be determined using system-level simulation is explained. |
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| 1 : | Laboratoire de Conception et d'Intégration des Systèmes (LCIS) |
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Institut Polytechnique de Grenoble - Grenoble Institute of Technology – Université Pierre-Mendès-France - Grenoble II |
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| 2 : | Laboratoire d'Informatique de Grenoble (LIG) |
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Université Joseph Fourier - Grenoble I – Institut Polytechnique de Grenoble - Grenoble Institute of Technology – Université Pierre-Mendès-France - Grenoble II – CNRS : UMR5217 |
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| Domaine | : | Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique |
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| RFID – on-line testing – FMEA – RFID system model – middleware – anti-collision protocol |
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| hal-00491923, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00491923 | |
| oai:hal.archives-ouvertes.fr:hal-00491923 | |
| Contributeur : Vincent Beroulle | |
| Soumis le : Lundi 14 Juin 2010, 16:23:47 | |
| Dernière modification le : Lundi 14 Juin 2010, 16:23:47 | |
