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| HAL : hal-00491699, version 1 |
| Fiche détaillée |  Récupérer au format |
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| Journal of Electronic Testing 26, 3 (2010) 355-365 |
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| Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors |
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| Luca Testa 1, 2Herve Lapuyade 1 |
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| (12/04/2010) |
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| A complete study of the fault coverage achievable on two Radio Frequency (RF) Voltage Controlled Oscillators (VCO) is carried out. The peak-to-peak output voltage detection grants the maximal catastrophic and parametric fault coverage. The VCOs and the BIST (Built-In Self-Test) circuitry are designed using the STM CMOS 65 nm process. The frequency of oscillation is 3.6 GHz and the phase noise obtained at 1 MHz offset from the carrier is of −121.7 dBc/Hz for VCO1 and of −118.8 dBc/Hz for VCO2. The performances of the VCOs are simulated before and after the insertion of the circuitry for the BIST, in order to confirm the transparency of the BIST |
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| 1 : | Laboratoire de l'intégration, du matériau au système (IMS) |
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CNRS : UMR5218 – Université Sciences et Technologies - Bordeaux I – Institut Polytechnique de Bordeaux |
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| 2 : | ST Microelectronics (ST Microelectronics, Crolles) |
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ST microelectronics |
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| Domaine | : | Sciences de l'ingénieur/Electronique |
| hal-00491699, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00491699 | |
| oai:hal.archives-ouvertes.fr:hal-00491699 | |
| Contributeur : Equipe Conception De Circuits | |
| Soumis le : Lundi 14 Juin 2010, 10:21:32 | |
| Dernière modification le : Lundi 14 Juin 2010, 10:21:32 | |
