High altitude experiments to evaluate SEU sensitivity of advanced SRAMs

Raoul Velazco (1) , P. Peronnard (1) , C. Silva Cardenas (2) , S. Fernandez (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 Departamento de Biología Vegetal

Integrated circuits are sensitive to the effects of natural radiation. This paper describes the test platforms developped to perform high altitude experiments devoted to obtain SEU error-rates of SRAMs operating at high altitude. Two experiments were developped using a Gbyte memory board. The first was installed in the payload of a balloon flying at about 30000 mts, the second one being runing at 3800 mts above sea level in the city of Cusco, Peru. Preliminary resulta are shown and discussed.

Mots clés: SRAM; SEU

Domaines: Micro et nanotechnologies/Microélectronique

Raoul Velazco, P. Peronnard, C. Silva Cardenas, S. Fernandez. High altitude experiments to evaluate SEU sensitivity of advanced SRAMs. XVth IBERCHIP Workshop, Mar 2009, Buenos Aires, Argentina. pp.463-466. ⟨hal-00472112⟩