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Article Dans Une Revue Journal of Physics: Conference Series Année : 2009

Depth dependent local structures in CoPt thin films

Résumé

X-ray absorption spectroscopy (XAS) has been used to clarify the thicknessdependent magnetic properties in nanometric CoPt films. We get benefit from the variation of the sampling depth with the grazing angle to investigate the variations of the local order within the film. In order to properly resconstruct the 3D information the experiments were performed either in the in-plane as in the out-of-plane geometries and supported by ab initio calculations. A depth dependence in the chemical order is revealed and the magnetic behavior is interpreted within this framework.
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Dates et versions

hal-00443725 , version 1 (04-01-2010)

Identifiants

Citer

Narcizo M. Souza-Neto, Aline Y. Ramos, Hélio Tolentino, Yves Joly. Depth dependent local structures in CoPt thin films. Journal of Physics: Conference Series, 2009, 190, pp.012112. ⟨10.1088/1742-6596/190/1/012112⟩. ⟨hal-00443725⟩

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