HAL : hal-00406631, version 1

arXiv : 0907.4015

DOI : 10.1103/PhysRevLett.103.036802

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Physical Review Letters 103 (2009) 036802

Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy

Laurent Nony 1, Adam S. Foster 2, Franck Bocquet 1, Christian Loppacher 1

(13/07/2009)

A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM simulator. The implementation mimics recent experimental results on the (001) surface of a bulk alkali halide crystal for which simultaneous atomic-scale topographical and Contact Potential Difference (CPD) contrasts were reported. The local CPD does reflect the periodicity of the ionic crystal, but not the magnitude of its Madelung surface potential. The imaging mechanism relies on the induced polarization of the ions at the tip-surface interface owing to the modulation of the applied bias voltage. Our findings are in excellent agreement with previous theoretical expectations and experimental observations.

1 :	Institut Matériaux Microélectronique Nanosciences de Provence (IM2NP)
	CNRS : UMR6242 – Université Paul Cézanne - Aix-Marseille III
2 :	Department of Physics
	Tampere University of Technology

Domaine

:

Physique/Physique/Agrégats Moléculaires et Atomiques

Mots Clés : on-contact Atomic Force Microscopy – Kelvin Probe Force Microscopy – Local Contact Potential Difference – Short-range Electrostatic Force – Madelung Surface Potential – Ionic crystal – atomistic simulations

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Contributeur : Laurent Nony <>

Soumis le : Jeudi 23 Juillet 2009, 11:17:42

Dernière modification le : Jeudi 23 Juillet 2009, 11:29:45