Atomic scale characterization of deformation induced interfacial mixing in a Cu/V nanocomposite wire

Xavier Sauvage (1) , Cécile Genevois (1) , Gérald da Costa (1) , Viktor Pantsyrny (2)

1 GPM - Groupe de physique des matériaux
2 VNIINM - Bochvar Institute of Inorganic Materials

The microstructure of a Cu/V nanocomposite wire processed by cold drawing was investigated by high resolution transmission electron microscopy and atom probe tomography. The experimental data clearly reveal some deformation induced interfacial mixing where the vanadium filaments are nanoscaled. The mixed layer is a 2nm wide vanadium gradient in the fcc Cu phase. This mechanical mixing leads to the local fragmentation and dissolution of the filaments and to the formation of vanadium super saturated solid solutions in fcc Cu.

Mots clés: Copper; Nanocomposite; HAADF-STEM; Atom Probe Tomography; Intermixing

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Xavier Sauvage, Cécile Genevois, Gérald da Costa, Viktor Pantsyrny. Atomic scale characterization of deformation induced interfacial mixing in a Cu/V nanocomposite wire. Scripta Materialia, 2009, 61, pp.660-663. ⟨10.1016/j.scriptamat.2009.06.007⟩. ⟨hal-00402828⟩