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| HAL : hal-00328264, version 1 |
| Fiche détaillée |  Récupérer au format |
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| IEEE Transactions on Nuclear Science 53, 4 (2006) 1897-1901 |
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| Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation |
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| T. Mérelle 1S. Serre |
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| (2006) |
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| The charge sharing quantification in the case of neutron induced SEUs in a 130 nm bulk SRAM is presented. Conclusions on its contribution to the soft errors sensitivity evaluation using Monte-Carlo codes are underlined |
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| 1 : | Institut d'Electronique du Sud (IES) |
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CNRS : UMR5214 – Université Montpellier II - Sciences et techniques |
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| 2 : | ST Microelectronics (ST Microelectronics, Crolles) |
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ST microelectronics |
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| 3 : | STMicroelectronics (Crolles) (ST-CROLLES) |
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STMicroelectronics |
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| 4 : | EADS, Corporate Research Center |
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EADS Paris |
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| 5 : | Space Transportat |
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European Aeronaut Def & Space Co |
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| Domaine | : | Sciences de l'ingénieur/Electronique |
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| Bulk – charge sharing – diffusion – neutron – SEU – SRAM – TCAD simulations |
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| hal-00328264, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00328264 | |
| oai:hal.archives-ouvertes.fr:hal-00328264 | |
| Contributeur : Dauverchain Eric | |
| Soumis le : Vendredi 10 Octobre 2008, 08:48:21 | |
| Dernière modification le : Mercredi 22 Octobre 2008, 10:13:36 | |
