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| HAL: hal-00327412, version 1 |
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| 3th Workshop EOS/ESD/EMI, Toulouse : France (2006) |
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| OBIC technique for ESD defect localization : Influence of the experimental procedure |
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| F. Essely 1N. Guitard 2 |
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| (2006-05) |
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| 1: | Laboratoire de l'intégration, du matériau au système (IMS) |
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CNRS : UMR5218 – Université Sciences et Technologies - Bordeaux I – Institut Polytechnique de Bordeaux |
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| 2: | Laboratoire d'analyse et d'architecture des systèmes (LAAS) |
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CNRS : UPR8001 – Université Paul Sabatier [UPS] - Toulouse III – Institut National Polytechnique de Toulouse - INPT – Institut National des Sciences Appliquées (INSA) - Toulouse |
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| Subject | : | Engineering Sciences/Electronics Physics/Physics/Optics |
| hal-00327412, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00327412 | |
| oai:hal.archives-ouvertes.fr:hal-00327412 | |
| From: Frédéric Darracq | |
| Submitted on: Wednesday, 8 October 2008 14:22:14 | |
| Updated on: Wednesday, 8 October 2008 14:22:14 | |
