Optimization of low voltage metallized film capacitor geometry

Yannick Vuillermet (1) , Olivier Chadebec (1) , J.M. Lupin (2) , A. Saker (2) , Gérard Meunier (1) , Jean-Louis Coulomb (1)

1 G2ELab - Laboratoire de Génie Electrique de Grenoble
2 Rectiphase-Schneider Electric

Thermal constraint is one of the major cause of capacitor failures. In this paper, a loss model, based on electrode current distribution, is first established to determine, by numerical simulation, a temperature mapping of capacitor. This mapping is successfully compared to measurements. Then a shape optimization, coupling losses computing and finite-element method, is led in order to find parameters that give the best lifespan and the larger reactive power provided. Very interesting new geometries have been found out; they allow an increase in reactive power greater than the increase in volume.

Domaines: Energie électrique

Yannick Vuillermet, Olivier Chadebec, J.M. Lupin, A. Saker, Gérard Meunier, et al.. Optimization of low voltage metallized film capacitor geometry. IEEE Transactions on Magnetics, 2007, 43 (4), pp. 1569-1572. ⟨10.1109/TMAG.2007.892473⟩. ⟨hal-00283320⟩