Validating a dynamic signature monitoring approach using the LTL model checking technique
Résumé
Consequences of transient errors represent a significant problem for todays electronic circuits and systems. As the probability of such errors increases, incorporation of error detection and correction mechanisms is a major concern. This represents one of the major industry focuses. An important challenge is that traditional validation techniques do not cover the whole spectrum of single bit-flip fault scenarios. In this paper, a new signature analysis method is proposed. This technique was previously validated using simulation-based fault injection. This validation showed that no errors escape detection. In addition, we explore a verification approach based on model-checking targeting complete validation. It presents a fundamental advantage over classic fault-injection techniques: it covers all possible single bit-flip fault scenarios. Experimental results illustrate the effeciency of this validation approach over usual simulation-based techniques.