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| HAL: hal-00204574, version 1 |
| DOI: 10.1109/IPFA.2006.251044 |
| Detailed view |  Export this paper |
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| 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapour : Singapore (2006) |
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| Optimizing pulsed OBIC technique for ESD defect localization |
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| Fabien Essely 1Nicolas Guitard 2 |
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| (2006-07-01) |
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| 1: | Laboratoire de l'intégration, du matériau au système (IMS) |
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CNRS : UMR5218 – Université Sciences et Technologies - Bordeaux I – Institut Polytechnique de Bordeaux |
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| 2: | Laboratoire d'analyse et d'architecture des systèmes (LAAS) |
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CNRS : UPR8001 – Université Paul Sabatier [UPS] - Toulouse III – Institut National Polytechnique de Toulouse - INPT – Institut National des Sciences Appliquées (INSA) - Toulouse |
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| 3: | Centre National d'Etudes Spatiales (CNES) |
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CNES |
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| Subject | : | Engineering Sciences/Electronics |
| hal-00204574, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00204574 | |
| oai:hal.archives-ouvertes.fr:hal-00204574 | |
| From: Frédéric Darracq | |
| Submitted on: Tuesday, 15 January 2008 08:52:41 | |
| Updated on: Tuesday, 15 January 2008 08:52:41 | |
