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THERMINIC 2007, Budapest : Hungary (2007)
Evaluation of the impact of solder die attach versus epoxy die attach in a state of the art power package
J. Czernohorsky 1, B. Maj 1, Matthias Viering 1, L. Wright 2, G. Balanon 2
(2007-09)

Subject of this paper is the thermal investigation of epoxy (EDA) and solder (SDA) die attaches by a comparison of an ASIC with multiple heat sources in different package assemblies. Static and transient thermal measurements and simulations were performed to investigate the thermal behavior of two samples in a state of the art QFP power package differing only in the die attach material (EDA and SDA).
1:  Continental Teves AG
Continental Teves AG
2:  Texas Instruments Dallas
Texas Instruments Dallas
Physics/Condensed Matter/Materials Science
Solder die attach – epoxy die attach – absolute die temperatures
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therm07038.pdf(114.1 KB)

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