HAL : hal-00202527, version 1

arXiv : 0801.1007

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THERMINIC 2007, Budapest : Hungary (2007)

Short time die attach characterisation of semiconductor devices

P. Szabo 1, M. Rencz 2

(09/2007)

Thermal qualification of the die attach of semiconductor devices is a very important element in the device characterization as the temperature of the chip is strongly affected by the quality of the die attach. Voids or delaminations in this layer may cause higher temperature elevation and thus damage or shorter lifetime. Thermal test of each device in the manufacturing process would be the best solution for eliminating the devices with wrong die attach layer. In this paper we will present the short time thermal transient measurement method and the structure function evaluation through simulations and measurements for die attach characterization. We will also present a method for eliminating the very time consuming calibration process. Using the proposed methods even the in-line testing of LEDs can be accomplished.

1 :	Department of Electron Devices
	BUTE
2 :	MicReD Ltd, Budapest
	MicReD LTD

Domaine

:

Physique/Matière Condensée/Science des matériaux

Mots Clés : Reliability Issues – Temperature Mapping

hal-00202527, version 1

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Soumis le : Lundi 7 Janvier 2008, 12:10:53

Dernière modification le : Lundi 7 Janvier 2008, 15:50:30