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| HAL: hal-00185408, version 1 |
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| Quality and Reliability Engineering International 10 (1994) 1 |
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| Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing |
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| Pascal Fouillat 1Stéphane Gervais-Ducouret 1 |
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| (1994) |
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| 1: | Laboratoire de l'intégration, du matériau au système (IMS) |
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CNRS : UMR5218 – Université Sciences et Technologies - Bordeaux I – Institut Polytechnique de Bordeaux |
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| Subject | : | Engineering Sciences/Micro and nanotechnologies/Microelectronics |
| hal-00185408, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00185408 | |
| oai:hal.archives-ouvertes.fr:hal-00185408 | |
| From: Ims Import | |
| Submitted on: Tuesday, 6 November 2007 09:05:26 | |
| Updated on: Tuesday, 6 November 2007 09:36:39 | |
