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22nd IEEE Instrumentation and Measurement Technology Conference (IMTC) 2005, Canada (2005)
Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics
Grégory Andriamonje 1, Vincent Pouget 1, Yves Ousten 1, Dean Lewis 1, Pascal Fouillat 1, Yves Danto 1
(2005)
1:  Laboratoire de l'intégration, du matériau au système (IMS)
CNRS : UMR5218 – Université Sciences et Technologies - Bordeaux I – Institut Polytechnique de Bordeaux
Engineering Sciences/Micro and nanotechnologies/Microelectronics

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