Smart Temperature Sensor for Thermal Testing of Cell-Based ICs

S. A. Bota (1) , M. Rosales (1) , J. L. Rossello (1) , J. Segura (1)

1 Grup de Tecnologia Electronica

In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits. The proposed smart temperature sensor uses a ring-oscillator composed of complex gates instead of inverters to optimize their linearity. Simulation results from a 0.18µm CMOS technology show that the non-linearity error of the sensor can be reduced when an adequate set of standard logic gates is selected.

Domaines: Architectures Matérielles [cs.AR]; Electronique

S. A. Bota, M. Rosales, J. L. Rossello, J. Segura. Smart Temperature Sensor for Thermal Testing of Cell-Based ICs. DATE'05, Mar 2005, Munich, Germany. pp.464-465. ⟨hal-00181652⟩