Hybrid BIST Based on Repeating Sequences and Cluster Analysis

Lei Li (1) , Krishnendu Chakrabarty (2)

1 Freescale Semiconductor, Inc., Austin
2 EE Dept.

We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use cluster analysis for sequence extraction, and encode deterministic patterns on the basis of the stored sequences. Experimental results for the ISCAS-89 benchmark circuits show that the proposed approach often requires less on-chip storage and test data volume than other recent BIST methods.

Domaines: Architectures Matérielles [cs.AR]; Electronique

Lei Li, Krishnendu Chakrabarty. Hybrid BIST Based on Repeating Sequences and Cluster Analysis. DATE'05, Mar 2005, Munich, Germany. pp.1142-1147. ⟨hal-00181286⟩