New Schemes for Self-Testing RAM

Gh. Bodean (1) , D. Bodean (1) , A. Labunetz (1)

1 Technical University of Moldova

This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.

Domaines: Architectures Matérielles [cs.AR]; Electronique

Gh. Bodean, D. Bodean, A. Labunetz. New Schemes for Self-Testing RAM. DATE'05, Mar 2005, Munich, Germany. pp.858-859. ⟨hal-00181225⟩