The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

Z. Suszynski (1) , M. Kosikowski (1) , R. Duer (1)

1 Dept of Electronics and Comp Science

In this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the one evaluated basing upon experimenatal data.

Mots clés: artificial neural network; thermal properties; invers problem; complex contrast

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Z. Suszynski, M. Kosikowski, R. Duer. The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure. THERMINIC 2006, Sep 2006, Nice, France. pp.33-37. ⟨hal-00171351⟩