On parametric and nonparametric fault detection in linear closed-loop systems

Hamid Baïkeche (1) , Benoît Marx (1) , Didier Maquin (1) , José Ragot (1)

1 CRAN - Centre de Recherche en Automatique de Nancy

This paper deals with the problem of fault detection and isolation (FDI) in linear closed loop control systems. The presented approach uses model based techniques applied to linear systems. The residual generator proposed in the following is derived from transfer function representation of both open and closed loop system, and it is designed to be sensitive to parametric faults (e.g. actuator, process and sensor faults) and nonparametric faults (e.g. unknown inputs) which can occur in the plant.

Mots clés: Fault detection and isolation; linear systems; closed loop; sensitivity analysis; frequency domain

Domaines: Automatique / Robotique

Hamid Baïkeche, Benoît Marx, Didier Maquin, José Ragot. On parametric and nonparametric fault detection in linear closed-loop systems. 4th Workshop on Advanced Control and Diagnosis, ACD 2006, Nov 2006, Nancy, France. ⟨hal-00119376⟩