Depth-dependent chemical and magnetic local orders in thin magnetic films

Narcizo M. Souza-Neto (1, 2) , Aline Y. Ramos (3) , Hélio C. N. Tolentino (1, 3) , Alessandro Martins (4) , Antonio D. Santos (2)

1 LNLS - Laboratório Nacional de Luz Sìncrotron
2 DFMT - Dept. de Física dos Materiais e Mecânica
3 Laboratoire de Cristallographie
4 IF-UFG - Instituto de Física

We report on the use of x-ray absorption spectroscopy with resolved grazing incidence to clarify the thickness-dependent magnetic properties in nanometric CoPt films. We show that in the thinnest samples the chemical order that induces the perpendicular magnetic anisotropy has no depth dependence. However in the thicker samples the chemical order is depth-dependent along the film thickness, with a disordered layer close to the substrate. The ability of the experimental approach to adress the depth-dependence of the local structural parameters make it an unique tool, suitable for a large variety of nanometric structure where this dependence is an important problem

Mots clés: X-RAY; SCATTERING; ANISOTROPY; MAGNETIC MATERIAL

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Narcizo M. Souza-Neto, Aline Y. Ramos, Hélio C. N. Tolentino, Alessandro Martins, Antonio D. Santos. Depth-dependent chemical and magnetic local orders in thin magnetic films. Applied Physics Letters, 2006, 89, pp.111910. ⟨10.1063/1.2335782⟩. ⟨hal-00115980⟩