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| HAL : hal-00013569, version 1 |
| Fiche détaillée |  Récupérer au format |
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| Automatic-Testing-81-&-Test-Instrumentation, Brighton : United Kingdom (1981) |
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| A light efficient and microprocessor-oriented ATE |
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| B. Courtois 1C. Postigo 1 |
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| (1981) |
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| Presents the architecture of an automatic test equipment for a go-nogo test of microprocessors. The basic scheme of the test machine does not use the classical mechanism of test vectors, i.e. to apply vectors and check returned values, but the inherent capacities of a central processing unit. Basically, the ATE runs programs and hardware mechanisms detect the occurrences of special malfunctions. |
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| 1 : | Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) |
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CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG) |
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| Domaine | : | Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique |
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| logic-testing – ATE- – automatic-test-equipment – go-nogo-test – microprocessors- |
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| hal-00013569, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00013569 | |
| oai:hal.archives-ouvertes.fr:hal-00013569 | |
| Contributeur : Lucie Torella | |
| Soumis le : Mercredi 9 Novembre 2005, 11:57:19 | |
| Dernière modification le : Jeudi 23 Février 2006, 17:39:46 | |
