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| HAL : hal-00013451, version 1 |
| Fiche détaillée |  Récupérer au format |
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| Data-Processing:-Opportunities-and-Drawbacks.-Proceedings-of-Convention-Informatique, Paris : France (1985) |
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| Are VLSI circuits testable? |
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| B. Courtois 1 |
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| (1985) |
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| Testing integrated circuits is becoming more and more difficult due to their increasing complexity. How can VLSI circuits be tested? Classical methods consider either a logical representation or a functional abstraction. The limits of these methods have been revealed with VLSI and hence the question of the testability of these circuits exists. Built-in test, self-checking circuits and new tools allowing one to observe directly how a circuit is functioning, are some answers to the question. |
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| 1 : | Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) |
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CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG) |
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| Domaine | : | Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique |
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| integrated-circuit-testing – built-in-test – VLSI-circuits – logical-representation – functional-abstraction – testability- – self-checking-circuits |
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| hal-00013451, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00013451 | |
| oai:hal.archives-ouvertes.fr:hal-00013451 | |
| Contributeur : Lucie Torella | |
| Soumis le : Mardi 8 Novembre 2005, 14:51:31 | |
| Dernière modification le : Jeudi 23 Février 2006, 17:18:06 | |
