Robust generation of analytical redundancy equations andapplications to diagnosis

Frédéric Kratz (1) , Didier Maquin (1) , José Ragot (1)

1 CRAN - Centre de Recherche en Automatique de Nancy

A procedure for generating analytical redundancy equations for process fault detection and isolation is described. This procedure uses a direct approach by considering the relations betwen the inputs and the outputs of the process. Systems with known or partially known inputs are considered. A numerical example is presented

Domains: Automatic

Frédéric Kratz, Didier Maquin, José Ragot. Robust generation of analytical redundancy equations andapplications to diagnosis. 31st IEEE Conference on Decision and Control, CDC'92, Dec 1992, Tucson, United States. pp.2839-2841. ⟨hal-00009003⟩