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| HAL : hal-00008263, version 1 |
| DOI : 10.1109/ATS.1992.224415 |
| Fiche détaillée |  Récupérer au format |
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| (1992) |
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| Laser injection of spot defects on integrated circuits |
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| R. Velazco 1B. Martinet 1 |
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| (1992) |
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| Random spot defects may result in discrete faults such as line breaks and short circuits. Therefore they could contribute significantly to yield losses in stable fabrication lines of VLSI integrated circuits. The authors show how to use laser based equipment to inject such faults at the circuit level. Experimental results carried out on 32 bits microprocessors are presented and point out one of the main applications of this approach: the test sequence improvement. |
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| 1 : | Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) |
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CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG) |
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| Domaine | : | Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique |
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| random-processes – logic-testing – spot-defects – integrated-circuits – line-breaks – short-circuits – yield-losses – VLSI- – microprocessors- – test-sequence-improvement – 32-bits |
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| hal-00008263, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00008263 | |
| oai:hal.archives-ouvertes.fr:hal-00008263 | |
| Contributeur : Lucie Torella | |
| Soumis le : Lundi 29 Août 2005, 11:20:37 | |
| Dernière modification le : Lundi 29 Août 2005, 11:20:37 | |
