Single event upsets on a read only memory based complex programmable logic device

F. Faure (1) , Raoul Velazco (2)

1 IASF-MI - Istituto di Astrofisica Spaziale e Fisica Cosmica - Milano
2 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés

SEU susceptibility of a ROM-based CPLD has been measured. Four different cross-sections for the same flip-flops are reported, putting in evidence the need for carefully planning the test pattern used during evaluation.

Mots clés: single-event-upsets; read-only-memory-based-complex-programmable-logic-device; SEU-susceptibility; ROM-based-CPLD; flip-flop-cross-sections; test-pattern

Domaines: Micro et nanotechnologies/Microélectronique

F. Faure, Raoul Velazco. Single event upsets on a read only memory based complex programmable logic device. 2003, pp.279-82. ⟨hal-00008186⟩