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Article Dans Une Revue Physical Review Letters Année : 2016

Microwave-induced resistance oscillations as a classical memory effect

Résumé

By numerical simulations and analytical studies, we show that the phenomenon of microwave-induced resistance oscillations can be understood as a classical memory effect caused by re-collisions of electrons with scattering centers after a cyclotron period. We develop a Drude-like approach to magneto-transport in presence of a microwave field, taking account of memory effects, and find an excellent agreement between numerical and analytical results, as well as a qualitative agreement with experiment.
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hal-01360270 , version 1 (03-06-2021)

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Y. M. Beltukov, Michel Dyakonov. Microwave-induced resistance oscillations as a classical memory effect. Physical Review Letters, 2016, 116 (17), pp.176801. ⟨10.1103/PhysRevLett.116.176801⟩. ⟨hal-01360270⟩
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